Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1985-01-07
1987-03-03
Buczinski, Stephen C.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356364, G01J 400
Patent
active
H00002305
ABSTRACT:
A miniaturized ellipsometric testing device having a laser for precisely impinging a prescribed beam of light upon a surface to be tested and a detector for capturing the reflected impinged beam only within prescribed limits. The value of the reflected impinged beam, which is transmissible to the detector, is used in determination of the validity of the surface tested; the miniaturized device is couplable to the laser light source and the detector by fiber optic cables.
REFERENCES:
patent: 3699350 (1972-10-01), Holdaway
patent: 3761186 (1973-09-01), Wason
patent: 4315688 (1982-02-01), Pryor
patent: 4381151 (1983-04-01), Smith
Buczinski Stephen C.
Maslow James E.
Singer Donald J.
The United States of America as represented by the Secretary of
Wallace Linda J.
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