Method of measuring thickness of a multi-layers film

Method of monitoring a laser crystallization process

Method of monitoring ion implants by examination of an...

Method of monitoring the fabrication of thin film layers...

Method of performing optical measurement on a sample

Method of reducing the effect of noise in determining the...

Methodology for providing good data at all wavelengths over...

Methods and apparatus for analyzing mirror reflectance

Methods and apparatus for measuring an electromagnetic...

Methods and apparatus for measuring refractive index and...

Methods and apparatus for measuring refractive index and...

Methods and apparatus for polarized reflectance spectroscopy

Methods and systems for determining a property of a specimen...

Methods for uncorrelated evaluation of parameters in parameteriz

Methods for uncorrelated evaluation of parameters in...

Metrology system with spectroscopic ellipsometer and...

Microarray scanning

Microroughness-blind optical scattering instrument

Modulated scatterometry

Modulated scatterometry