Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1998-11-06
2000-07-11
Pham, Hoa Q.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
209536, 209586, 25055924, 25055939, G01B 1110
Patent
active
060881119
ABSTRACT:
Selection and control device to count bars being fed separated orthogonally to their axis on a plane and cooperating with a translating device such as a screw-type translator, the device including two optical monitors and a processing unit, the optical monitors being arranged at an angle with their apex substantially on the plane on which the bars are fed and whose respective monitoring axes cooperates with a portion of the plane on which the bar being fed passes. The respective monitoring axes have an angle of incidence with respect to the plane on which the bars are fed in the proximity of a common point cooperating substantially with the positioning seating of the bars on the translating device, each of the monitors lying on a plane substantially orthogonal to the plane on which the bars are fed, and to the axis of the bars, and including respective angles (".alpha.",".beta.") with respect to a line vertical to the plane of feed, the angles (".alpha.", ".beta.") defining an angle (".gamma.") at the apex, the apex lying substantially on a line vertical to the plane of feed of the bars. The processing unit is suitable to receive the signal concerning the field explored by each of the optical monitors, to transform the signal into a dimensional value, to compare the dimensional value with the pre-set nominal diameter of the bars and to supply, according to this comparison, an indication as to the number of bars present in the seating of the translating device.
REFERENCES:
patent: 3373868 (1968-03-01), Missioux
patent: 3897156 (1975-07-01), Chasson
patent: 4271967 (1981-06-01), Matsuo et al.
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patent: 5666204 (1997-09-01), Koskenohi
Patent Abstracts of Japan vol. 14, No. 272 (P-1060), Jun. 12, 1990 & JP 02 077892 A (Toshiba Corp) Mar. 16, 1990, Abstract.
Patent Abstracts of Japan, vol. 15, No. 111 (P-1180), Mar. 18, 1991, & JP-03 002993 A (Sumitomo Metal Ind. Ltd), Jan. 9, 1991--Abstract.
Bordignon Giuseppe
Ciani Lorenzo
Centro Automation SpA
Danielli C. Officine Meccaniche SpA
Pham Hoa Q.
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