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System for the measurement of the cut length of moving articles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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System for the measurement of the cut length of moving articles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Temperature-compensated laser measuring method and apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Test-glass changer

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Testing opaque workpieces, particularly tiny or thin elongated o

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thickness measuring apparatus using light from slit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thickness measuring device for insulating glass

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thickness monitoring

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Thin film thickness and optimal focus measuring using reflectivi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thin film thickness monitor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thin film thickness monitor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Tube diameter measuring apparatus and method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Two-dimensional beam deflector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Volumetric measurement of particles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Wafer diameter/sectional shape measuring machine

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Width measurement of an image-bearing sheet

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Wiring pattern line width measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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