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System and method for optimizing the grid and intrafield registr

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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System for detecting a signal for aligning two bodies and signal

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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System for positioning an object in an optical projection system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Systems, methods and computer program products for detecting the

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Target design and methods for scatterometry overlay...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Time measurement device and method useful in a laser range camer

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Two-dimensional imaging with line arrays

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Two-dimensional structure for determining an overlay...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Universal alignment marks for semiconductor defect capture and a

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Variable wavelength optical alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Wafer alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Wafer alignment system using parallel imaging detection

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Wafer tilt compensation in zone plate alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Wafer-level testing of optical and optoelectronic chips

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