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Using query language for event filtering and aggregation

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Using query language for provider and subscriber registrations

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Using redundant spares to reduce storage device array...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Using SAM in error correcting code encoder and decoder...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Data formatting to improve error detection correction...
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Using selective omission to compress on-chip data processor...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Using statistical signatures for testing high-speed circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Using task description blocks to maintain information...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Using type bits to track storage of ECC and predecode bits...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Using virtual copies in a failover and failback environment

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Utilizing multiple bitstreams to avoid localized defects in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing multiple test bitstreams to avoid localized...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing multiple test bitstreams to avoid localized...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing multiple test bitstreams to avoid localized...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing serializer-deserializer transmit and receive pads...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Utilizing slow ASIC logic BIST to preserve timing integrity...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Validating data using processor instructions

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Validating test signal connections within an integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Validation of procedures

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Valuation of tester accuracy

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Variable bit width cache memory architecture

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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