Using query language for event filtering and aggregation

Using query language for provider and subscriber registrations

Using redundant spares to reduce storage device array...

Using SAM in error correcting code encoder and decoder...

Using selective omission to compress on-chip data processor...

Using statistical signatures for testing high-speed circuits

Using task description blocks to maintain information...

Using type bits to track storage of ECC and predecode bits...

Using virtual copies in a failover and failback environment

Utilizing multiple bitstreams to avoid localized defects in...

Utilizing multiple test bitstreams to avoid localized...

Utilizing multiple test bitstreams to avoid localized...

Utilizing multiple test bitstreams to avoid localized...

Utilizing serializer-deserializer transmit and receive pads...

Utilizing slow ASIC logic BIST to preserve timing integrity...

Validating data using processor instructions

Validating test signal connections within an integrated circuit

Validation of procedures

Valuation of tester accuracy

Variable bit width cache memory architecture