Using query language for event filtering and aggregation
Using query language for provider and subscriber registrations
Using redundant spares to reduce storage device array...
Using SAM in error correcting code encoder and decoder...
Using selective omission to compress on-chip data processor...
Using statistical signatures for testing high-speed circuits
Using task description blocks to maintain information...
Using type bits to track storage of ECC and predecode bits...
Using virtual copies in a failover and failback environment
Utilizing multiple bitstreams to avoid localized defects in...
Utilizing multiple test bitstreams to avoid localized...
Utilizing multiple test bitstreams to avoid localized...
Utilizing multiple test bitstreams to avoid localized...
Utilizing serializer-deserializer transmit and receive pads...
Utilizing slow ASIC logic BIST to preserve timing integrity...
Validating data using processor instructions
Validating test signal connections within an integrated circuit
Validation of procedures
Valuation of tester accuracy
Variable bit width cache memory architecture