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Semiconductor testing apparatus and method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor testing apparatus for testing semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor testing apparatus for testing semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor testing circuit, semiconductor storage device,...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor testing equipment, testing method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor wiring substrate, semiconductor device, method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sensor apparatus and monitoring method of control system...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Sensor fault detection, isolation and accommodation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Separable cyclic redundancy check

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Separately controlled scan paths of functional registers...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequence error event detection and correction using fixed block

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Sequence estimating

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Sequence-based verification method and system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential decoding apparatus and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Sequential decoding method and apparatus thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Sequential flow-control and FIFO memory devices having error...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Sequential pattern extracting apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan based techniques to test interface between...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan technique for testing integrated circuits...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan technique providing enhanced fault coverage...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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