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Remote control signal receiver and remote control signal...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
Reexamination Certificate

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Remote integrated circuit testing method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Remote module for a communications network

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Remote module for a communications network

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Remote reporting system for digital transmission line elements

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
Patent

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Remote test module for automatic test equipment

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Remotely monitoring execution of a program

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Removable and replaceable tap domain selection circuitry

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Removable and replaceable TAP domain selection circuitry

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Remove signal from TAP selection circuitry to multiplexer...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Remove signal from TAP selection circuitry to multiplexer...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Removing the effects of unknown test values from compacted...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Rendering and correcting data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Repair of address-specific leakage

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Repair of semiconductor memory device via external command

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Repair techniques for memory with multiple redundancy

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Repairing errors in data of MBMS service

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Repetitive pattern testing circuit for AC-coupled systems

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
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Replacement data storage circuit storing address of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Replacement messages for identifying and preventing errors...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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