Remote integrated circuit testing method and apparatus

Details Remote integrated circuit testing method and apparatus Remote integrated circuit testing method and apparatus

2007-06-26

2007-06-26

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000

Reexamination Certificate

active

11094455

ABSTRACT:
A method and system for remotely testing an integrated circuit installed in an integrated circuit system is presented. The integrated circuit is equipped with test structures for testing functional blocks within the integrated circuit, and a test access mechanism configured to receive test vectors for controlling the test structures. Test vectors are applied, via the parallel port of a remote computer and parallel cable, to pins of the parallel port of the integrated circuit system, which are connected to the signal ports of the test access mechanism implemented in the integrated circuit of interest, thereby allowing remote testing of the integrated circuit while the integrated circuit is installed in its native system.

REFERENCES:
patent: 4517512 (1985-05-01), Petrich et al.
patent: 4788708 (1988-11-01), Hendrix
patent: 4980887 (1990-12-01), Dively et al.
patent: 5027343 (1991-06-01), Chan et al.
patent: 6275962 (2001-08-01), Fuller et al.
patent: 6393591 (2002-05-01), Jenkins et al.

Affiliated with

Also associated with

Rating

Remote integrated circuit testing method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Remote integrated circuit testing method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Remote integrated circuit testing method and apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3850082