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Multiple probe test equipment with channel identification

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Multiple processing system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
Reexamination Certificate

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Multiple program decoding for digital audio broadcasting and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Multiple program unequal error protection for digital audio...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Multiple protection group codes having maximally recoverable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Multiple scan chains with pin sharing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiple uses for BIST test latches

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiple uses for BIST test latches

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiple-capture DFT system for detecting or locating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiple-capture DFT system for detecting or locating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiple-capture DFT system for scan-based integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiple-capture DFT system for scan-based integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiple-capture DFT system for scan-based integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiple-level data compression read mode for memory testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
Reexamination Certificate

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Multiple-rate channel ENDEC in a commuted read/write channel...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Multiple-track magneto-resistive certification and thermal...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Multiplexer connecting TDI or AX1/TDI to data and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Multiplexing method and apparatus thereof for data switching

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
Reexamination Certificate

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Multiply redundant raid system and XOR-efficient method and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Multipoint TDM data distribution system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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