Multiplexer connecting TDI or AX1/TDI to data and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S729000, C714S733000

Reexamination Certificate

active

07925943

ABSTRACT:
The present disclosure describes novel methods and apparatuses for directly accessing JTAG Tap domains that exist in a scan path of many serially connected JTAG Tap domains. Direct scan access to a selected Tap domain by a JTAG controller is achieved using auxiliary digital or analog terminals associated with the Tap domain and connected to the JTAG controller. During direct scan access, the auxiliary digital or analog terminals serve as serial data input and serial data output paths between the selected Tap domain and the JTAG controller.

REFERENCES:
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patent: 6115763 (2000-09-01), Douskey et al.
patent: 6385749 (2002-05-01), Adusumilli et al.
patent: 6425100 (2002-07-01), Bhattacharya
patent: 6829730 (2004-12-01), Nadeau-Dostie et al.
patent: 7395471 (2008-07-01), Whetsel
Lee Whetsel, “An IEEE Based Test Access Architecture for ICs With Embedded Cores”, International Test Conference 1997 Proceedings, Nov. 1-6, 1997.

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