Integrated circuit with parameter measurement
Integrated instrument driver network
Integrated load simulator
Integrated process condition sensing wafer and data analysis...
Integrated stepwise statistical process control in a plasma...
Integrated tool for compliance testing within an enterprise...
Intelligent modelling of process and tool health
Interface for managing test definitions
Internal bias measure with onboard ADC for electronic devices
Interpolator testing system
Joint approach of out-of-range detection and fault detection...
JTAG-based software to perform cumulative array repair
Late binding of variables during test case generation for...
Latent fault detection in redundant power supply systems
Line tester
Local device and process diagnostics in a process control networ
Low circuit overhead built in self test for oversampled ADC's
Low cost test for IC's or electrical modules using standard...
Low cost, highly parallel memory tester
Low power scan testing techniques and apparatus