Low cost test for IC's or electrical modules using standard...

Details Low cost test for IC's or electrical modules using standard... Low cost test for IC's or electrical modules using standard...

2004-10-28

2008-08-12

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

07412342

ABSTRACT:
Low cost test for Integrated Circuits or electrical modules using a reconfigurable logic device is described. In one embodiment, the invention includes configuring a reconfigurable logic device to comply with input standards of a device under test, applying test signals to the device under test, detecting output results of the device under test, and analyzing the detected output results.

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Davis J. S. et al., “Multi-purpose Digital Test Core Utilizing Programmable Logic”, Proceedings International Test Conference 2002, Baltimore, MD., Oct. 7-10, 2002, International Test Conference, New York, NY: IEEE, US, Oct. 7, 2002, pp. 438-445, XP010609770, ISBN: 0-7803-7542-4. The whole document.
PCT International Search Report, PCT/US2005/039319, filing date Oct. 27, 2005, Applicant, Intel Corporation.

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