Late binding of variables during test case generation for...
Latent fault detection in redundant power supply systems
Line tester
Local device and process diagnostics in a process control networ
Low circuit overhead built in self test for oversampled ADC's
Low cost test for IC's or electrical modules using standard...
Low cost, highly parallel memory tester
Low power scan testing techniques and apparatus
Low voltage test mode operation enable scheme with hardware safe
Low-impact analyzer interface
Low-power/wideband transfer function measurement method and...
LSI test program protection method and LSI test method