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Late binding of variables during test case generation for...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Latent fault detection in redundant power supply systems

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Line tester

Data processing: measuring – calibrating – or testing – Testing system – Of sensing device
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Local device and process diagnostics in a process control networ

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means
Patent

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Low circuit overhead built in self test for oversampled ADC's

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Low cost test for IC's or electrical modules using standard...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Low cost, highly parallel memory tester

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent

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Low power scan testing techniques and apparatus

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Low voltage test mode operation enable scheme with hardware safe

Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
Patent

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Low-impact analyzer interface

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Low-power/wideband transfer function measurement method and...

Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
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LSI test program protection method and LSI test method

Data processing: measuring – calibrating – or testing – Testing system – Including program set up
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