Low cost, highly parallel memory tester

Details Low cost, highly parallel memory tester Low cost, highly parallel memory tester

1997-09-09

1998-08-11

Arana, Louis M.

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

702118, 39518301, 39518306, 371 221, 371 211, 324 731, 3241581, G06F 1100

Patent

active

057941750

ABSTRACT:
Automatic test equipment for semiconductor memories that provides testing of large arrays of semiconductor memory chips in parallel. Such massively parallel memory testing greatly enhances test throughput, thereby reducing cost. It greatly enhances the economics of testing memory device made according to a RAMBUS standard, which includes a low speed port and a medium speed port because it allows the same automatic test equipment to economically be used to test devices with the low speed port and the medium speed port.

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patent: 5617531 (1997-04-01), Crouch et al.
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