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Same virtual machine mode for distributed test execution

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Scalable multithreaded system testing tool

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means
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Scalable parallel processing apparatus and method for performing

Data processing: measuring – calibrating – or testing – Testing system – Including program set up
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Scan chain disable function for power saving

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Scan test viewing and analysis tool

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Scan vector support for event based test system

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Screening optical transceiver modules for electrostatic...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Seismic prospecting method and device using simultaneous...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Self aligning sensor array system

Data processing: measuring – calibrating – or testing – Testing system – Of sensing device
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Self-generated test automation

Data processing: measuring – calibrating – or testing – Testing system – Including program set up
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Self-optimizing adjustment algorithm

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-test architecture to implement data column redundancy...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-test circuit for high-definition multimedia interface...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-test with split, asymmetric controlled driver output stage

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-testable spacecraft for self-testing analog functions

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system
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Self-testing of smart line cards

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device and semiconductor device testing method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device and testing circuit which can carries...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device capable of test mode operation

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device fabrication method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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