Apparatus and method for testing semiconductor device
Application programming interface for synchronizing multiple...
Automatic optical signal type identification method
Characterization of self-timed sequential circuits
Circuit for producing a variable frequency clock signal...
Computer-based real-time transient pulse monitoring system...
Continuous digital background calibration in pipelined ADC...
Continuous digital background calibration in pipelined ADC...
Delay measurement system
Determining impact of test operations at a product assembly...
Device and method for testing an electrical circuit
Digital data pattern detection methods and arrangements
Digital signal sampler
Digital storage oscilloscope with simultaneous primary...
Disc interface, disc interface system having the same, and...
Distributed trigger node
Electrical over stress (EOS) monitor
Frequency margin testing
Functional-pattern management system for device verification
Generating and controlling analog and digital signals on a...