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Apparatus and method for testing semiconductor device

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Application programming interface for synchronizing multiple...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Automatic optical signal type identification method

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Characterization of self-timed sequential circuits

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Circuit for producing a variable frequency clock signal...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Computer-based real-time transient pulse monitoring system...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Continuous digital background calibration in pipelined ADC...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Continuous digital background calibration in pipelined ADC...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Delay measurement system

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Determining impact of test operations at a product assembly...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Device and method for testing an electrical circuit

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Digital data pattern detection methods and arrangements

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Digital signal sampler

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Digital storage oscilloscope with simultaneous primary...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Disc interface, disc interface system having the same, and...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Distributed trigger node

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Electrical over stress (EOS) monitor

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Frequency margin testing

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Functional-pattern management system for device verification

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Generating and controlling analog and digital signals on a...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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