Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Reexamination Certificate
2006-09-12
2006-09-12
Nghim, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Signal generation or waveform shaping
C341S118000, C341S120000, C341S131000, C341S161000, C702S085000, C702S089000, C702S125000, C702S127000
Reexamination Certificate
active
07107175
ABSTRACT:
Disclosed are new methods and systems for achieving calibration in a pipelined ADC system. The methods and systems may be used to provide continuous digital background calibration in a pipelined ADC. Component mismatch error from each DAC in the pipeline is tabulated to provide an integral nonlinearity profile, which is subtracted from the ADC transfer characteristic.
REFERENCES:
patent: 6473012 (2002-10-01), Hellberg et al.
patent: 6556158 (2003-04-01), Steensgaard-Madsen
patent: 6784814 (2004-08-01), Nair et al.
patent: 6822601 (2004-11-01), Liu et al.
Kinyua Martin Kithinji
Maloberti Franco
Brady III W. James
Le John
Nghim Michael
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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