Determining impact of test operations at a product assembly...

Details Determining impact of test operations at a product assembly... Determining impact of test operations at a product assembly...

2006-08-08

2006-08-08

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

C702S089000, C702S176000, C702S187000, C700S306000, C368S089000

Reexamination Certificate

active

07089144

ABSTRACT:
A method and apparatus for establishing an average test time (TA) include determining a first time interval (TG) nominally associated with non-failing testing of a unit under test (UUT), and determining a second time interval (TPR) nominally associated with troubleshooting and repairing a failed unit under test. Additionally, a percent yield (Y) nominally associated with a proportion of non-failing units under test is determined. The average test time is a sum of the first time interval associated with the non-failing testing of the UUT, and a ratio of the second time interval associated with troubleshooting and repair of a failed UUT with respect to the yield.

REFERENCES:
patent: 3870953 (1975-03-01), Boatman et al.
patent: 4066882 (1978-01-01), Esposito
patent: 5953689 (1999-09-01), Hale et al.
patent: 6381556 (2002-04-01), Kazemi et al.

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