4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Signal generation or waveform shaping
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Precise delay measurement through combinatorial logic

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Reexamination Certificate

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Process for the computer-assisted measurement and testing of ele

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Patent

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