Apparatus and method for testing semiconductor device

Details Apparatus and method for testing semiconductor device Apparatus and method for testing semiconductor device

2007-10-16

2007-10-16

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

Reexamination Certificate

active

10732763

ABSTRACT:
A phase difference between a timing of rising or falling of the data read from a semiconductor device to be test and a timing of rising or falling of a reference clock outputted synchronized with the data is measured by operating sampling with strobe pulses configured with multi-phase pulses given the phase difference by a small amount in regard to the timing of the data and the timing of the reference clock. In addition, a glitch of the data is detected, and the quality of the semiconductor device to be tested is judged based on the phase difference and/or the glitch.

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