Characterization of self-timed sequential circuits

Details Characterization of self-timed sequential circuits Characterization of self-timed sequential circuits

2002-08-09

2004-09-28

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

C710S005000

Reexamination Certificate

active

06799134

ABSTRACT:

BACKGROUND OF THE INVENTION
This invention relates to the verification of burst-mode operation and the frequency characterization of self-timed sequential elements in burst mode.


REFERENCES:
patent: 5553276 (1996-09-01), Dean
patent: 6065126 (2000-05-01), Tran et al.
patent: 6167097 (2000-12-01), Marston et al.
patent: 6397362 (2002-05-01), Ishiyama

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