Delay measurement system

Details Delay measurement system Delay measurement system

2007-02-27

2007-02-27

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

C702S031000, C702S079000, C702S080000, C702S176000, C709S236000, C709S248000, C365S194000

Reexamination Certificate

active

10848468

ABSTRACT:
Performing delay measurement between master and slave devices. The master transmits a delay measuring signal at a fixed timing relative to a synchronous pattern signal in an overhead and transmits a frame signal in which an internal delay time, associated with a frame signal generation, from a delay measurement start timing to a transmission timing of the delay measuring signal is stored in the delay measuring signal as a master offset value. The slave adds an internal delay time associated with a frame signal generation to the master offset value of the frame signal, making a slave offset value and transmits an updated delay measuring signal with the slave offset value. The master calculates a delay time by subtracting the slave offset value from a time difference between a timing at which the delay measuring signal transmitted from the slave is received and the delay measurement start timing.

REFERENCES:
patent: 6236623 (2001-05-01), Read et al.
patent: 6674730 (2004-01-01), Moerder
patent: 6681099 (2004-01-01), Keranen et al.
patent: 2003/0128741 (2003-07-01), Chun
patent: 2003/0152110 (2003-08-01), Rune
patent: 2003/0185571 (2003-10-01), Lee et al.
patent: 2000-324535 (2000-11-01), None

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