Device and method for testing an electrical circuit

Details Device and method for testing an electrical circuit Device and method for testing an electrical circuit

2007-12-25

2007-12-25

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

C702S057000, C702S183000

Reexamination Certificate

active

11372470

ABSTRACT:
A method and device for testing an electrical circuit, which do not require a thorough electrical circuit simulation but reliably identifying circuit faults. Preferred embodiments generate a fault signal that indicates that a given state of the circuit, which is defined by an electrical state variable, could occur in an electrical circuit. Generally, electrical components are individually treated as short-circuited or non-conducting regarding each pair of connections of the components. An electrical state variable is permanently allocated to at least one network node or a connecting pin of the electrical circuit. Electrical state variables of the network nodes and connecting pins of the components that are to be treated as short-circuited are allocated to each network node and each connecting pin. An assessment is made at least based on the allocated state variables as to whether the given circuit state can occur.

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