LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Testing system,Of circuit

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MULTILAYER BOARD IN WHICH WIRING OF SIGNAL LINE THAT...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Multiple on-chip test runs and repairs for memories

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Multiple sweep point testing of circuit devices

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Multiplexer select line exclusivity check method and apparatus

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Network analyzer applying loss compensation using port...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Network analyzer, network analytical method and recording...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Network processor probing and port mirroring

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Non-deterministic protocol packet testing

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Non-invasive testing of smart cards

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Non-linear junction based electronics detection

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Nonvolatile memory microcomputer chip, and a method for...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Numerical test data reporting in an image file and...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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On circuit finalization of configuration data in a...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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On-chip test mechanism for transceiver power amplifier and...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Open-loop for waveform acquisition

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Optimization of die yield in a silicon wafer “sweet...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Optimized burn-in for fixed time dynamic logic circuitry

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Parametric device signature

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Pattern detection for integrated circuit substrates

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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PCI load card

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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