Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-08-30
2010-02-23
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S117000
Reexamination Certificate
active
07668683
ABSTRACT:
The present disclosure is directed to numerical test data reporting using an image file and subsequent analysis of the test data. A method for capturing and analyzing test data in accordance with an embodiment includes: capturing multi-bit integer values of test data; writing each multi-bit integer value to a multi-bit vertical field in an image file; extracting the multi-bit integer values from the multi-bit vertical fields in the image file; and analyzing the extracted multi-bit integer values.
REFERENCES:
patent: 6907379 (2005-06-01), Wu et al.
patent: 2007/0113134 (2007-05-01), Ferrante et al.
Cassels John J.
Ferrante William J.
Wu Stephen
Bui Bryan
Capella Steven
Hoffman Warnick LLC
International Business Machines - Corporation
Moffat Jonathan Teixeira
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