Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-04-25
2006-04-25
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S117000
Reexamination Certificate
active
07035751
ABSTRACT:
To provide a nonvolatile memory microcomputer with which a step of testing a microcomputer unit using a logic tester can be omitted, thereby reducing the testing cost. A memory tester supplies test data and expectation data to the nonvolatile memory microcomputer, and the nonvolatile memory microcomputer stores them in a nonvolatile memory. Subsequently, upon receiving an address signal, the nonvolatile memory outputs a test signal and an expectation signal based on test data and expectation data corresponding to the address signal. The test signal is supplied to a circuit block in the microcomputer unit, to drive the circuit block. The circuit block returns a test result signal, which is output to the memory tester together with the expectation signal. The memory tester compares the test result signal and the expectation signal, to judge whether the microcomputer unit operates correctly.
REFERENCES:
patent: 5048019 (1991-09-01), Albertsen
patent: 5450576 (1995-09-01), Kennedy
patent: 6285962 (2001-09-01), Hunter
patent: 6480799 (2002-11-01), Hunter
patent: 6829178 (2004-12-01), Koyama et al.
Fukushima Tetsuyuki
Kawahara Akifumi
Komiya Manabu
Kurata Masakazu
Shinagawa Masatoshi
Barlow John
McDermott Will & Emery LLP
Washburn Douglas N.
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