Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-05-01
2007-05-01
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C714S037000, C714S735000
Reexamination Certificate
active
10924675
ABSTRACT:
A test apparatus implements a method for testing electronic devices that exhibit non-deterministic behavior. The test apparatus includes a high-speed buffer queue for storing data packets. The data packets arrive at one end of the queue and, as they exit at the other end, are compared against expect data packets stored in memory. If the data packet exiting the buffer queue corresponds to response signals generated by the device under test during a non-deterministic (e.g., idle) state, the expect data packet is not retrieved from memory and the comparison is not made.
REFERENCES:
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patent: 6510398 (2003-01-01), Kundu et al.
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patent: 2002/0049942 (2002-04-01), Kawai
patent: 2003/0105607 (2003-06-01), Jones
patent: 2004/0267487 (2004-12-01), Brown et al.
Maassen Howard
Sivaram Angarai T.
West Burnell G.
Hoff Marc S.
Suglo Janet L
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