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Method and system for dynamic duration burn-in

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for generating self-testing and random...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for generating test pulses to test...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for identifying and locating defects in an...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for logic verification using mirror interface

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for logic verification using mirror interface

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for managing manufacturing test stations

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for testing a memory of a microprocessor

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for testing assembled mobile devices

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for testing assembled mobile devices

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for testing integrated circuits

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for testing rambus memory modules

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for testing RAMBUS memory modules

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for testing spas

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for the interactive testing of assembled...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for the interactive testing of assembled...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for timing measurement of embedded macro...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for verifying an embedded module of a...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for wafer and device-level testing of an...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Method and system for wideband device measurement and modeling

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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