Method and system for wideband device measurement and modeling

Details Method and system for wideband device measurement and modeling Method and system for wideband device measurement and modeling

2007-01-30

2007-01-30

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S106000, C702S126000

Reexamination Certificate

active

10898508

ABSTRACT:
The method for wideband device measurement and modeling includes: measurement of an electronic device to obtain a set of time domain raw data representing characteristics of said device; conversion of said time domain raw data into frequency domain raw data; calibration and correction of embedded errors according to said frequency domain raw data to obtain clean frequency domain data representing characteristics of said device; conversion of said frequency domain data into time domain clean data; and establishment of equivalent model of said device according to said time domain data. The time domain raw data are obtained by applying to said device an ultra short impulse and measuring said impulse and its response from said device. Conversion between said time domain data and said frequency domain data may be Fourier transform.

REFERENCES:
patent: 2005/0137811 (2005-06-01), Hsu et al.
patent: 2005/0248482 (2005-11-01), Goodman et al.
Joel Dunsmore, “Measuring and modeling package interconnects using vector network analyzers and time domain transforms”, Dec. 1998, IEEE, ARFTG Conference Digest, pp. 107-127.

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