Method and system for timing measurement of embedded macro...

Details Method and system for timing measurement of embedded macro... Method and system for timing measurement of embedded macro...

2007-05-01

2007-05-01

Barbee, Manuel L. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S125000, C713S400000

Reexamination Certificate

active

11061020

ABSTRACT:
A method and system is presented for measuring a data access time of an embedded macro module in an integrated circuit. A single external test signal is inputted into the embedded macro module for enabling a data input therein and extracting a data output therefrom. A pulse width of the single external test signal is incrementally increased until a latch of the data output is observed. Then, the data access time is obtained, as its substantially equals a time interval of the increased pulse width.

REFERENCES:
patent: 4878209 (1989-10-01), Bassett et al.
patent: 5822228 (1998-10-01), Irrinki et al.
patent: 6014033 (2000-01-01), Fitzgerald et al.
patent: 2002/0031199 (2002-03-01), Rolston et al.

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