Method and system for testing integrated circuits

Details Method and system for testing integrated circuits Method and system for testing integrated circuits

2006-07-21

2008-05-27

Barlow, Jr., John E. (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

07379837

ABSTRACT:
Method and system for testing application specific integrated circuit using a tester is provided. The method includes measuring output data timing values of the application specific integrated circuit with respect to a tester cycle in a first pass; measuring first strobe timing value and second strobe timing value with respect to the tester cycle in a second pass; and calculating data set-up timing values and data hold timing values with respect to the first strobe and the second strobe, using the output data timing values measured in the first pass and the first strobe timing value and second strobe timing value measured in the second pass. The tester includes an input vector generator that generates input data for the application specific integrated circuit that is coupled to a data processing unit that calculates data set-up timing values and data hold timing values.

REFERENCES:
patent: 6693436 (2004-02-01), Nelson
patent: 6980943 (2005-12-01), Aitken et al.
patent: 7260493 (2007-08-01), Laquai et al.
patent: 2005/0229132 (2005-10-01), Butt et al.
Wikipedia, “Application Specific Integrated Circuit”, Oct. 2007, pp. 1-7.

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