Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-08-07
2007-08-07
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C702S119000, C702S120000
Reexamination Certificate
active
11004265
ABSTRACT:
In one embodiment, a method may include generating a test code segment including a number of selected opcodes and executing the test code segment from a particular location within the memory for a first iteration. The method may also include saving a first test result of the execution of the test code segment after the first iteration. In addition, the method may include executing the test code segment for subsequent iterations and after each iteration of the test code segment, shifting the test code segment a predetermined number of locations from the particular location within the memory. The method may further include comparing test results of each subsequent iteration with the first test result and determining whether any of the subsequent test results are different than the first test result.
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Advanced Micro Devices , Inc.
Barlow John
Cherry Stephen J.
Curran Stephen J.
Kivlin B. Noäl
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