Method and system for generating test pulses to test...

Details Method and system for generating test pulses to test... Method and system for generating test pulses to test...

2007-02-20

2008-05-06

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S123000, C702S125000

Reexamination Certificate

active

07369957

ABSTRACT:
A method and system for generating test pulses to test electronic elements are disclosed. After determining a transmission clock, which is smaller than a test clock, and a serial of predetermined pulses, the serial of data bits corresponding to the serial of predetermined pulses can be generated. Then the serial of data bits can be transformed into a serial data stream for transmission. By transmitting the serial data stream according to the transmission clock, the serial of predetermined pulses corresponding to the test clock can be generated.

REFERENCES:
patent: 4885583 (1989-12-01), McCambridge
patent: 2002/0009132 (2002-01-01), Miller
patent: 2003/0043926 (2003-03-01), Terashima et al.

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