Methods and apparatus for producing an IC identification number
Methods and apparatus for statistical process control of test
Methods and apparatus for testing a clock signal
Methods and apparatus for testing electronic devices
Methods and structure for maintaining state information to...
Methods and systems for asynchronously testing a plurality...
Methods and systems for enhanced automated system testing
Methods and systems for generating test plans for...
Methods for analyzing critical defects in analog integrated...
Methods for delay-fault testing in field-programmable gate...
Methods for embedding and de-embedding balanced networks
Metrology hardware adaptation with universal library
Microprocessor and method of testing the same
Microsystems integrated testing and characterization system...
Microsystems integrated testing and characterization system...
Mixed signal device under test board interface
Mixed-signal core design for concurrent testing of...
Model-based testing via combinatorial designs
Module, electronic device and evaluation tool
Monitoring device with optimized buffer