Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-04-05
2005-04-05
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C702S121000, C702S122000
Reexamination Certificate
active
06876942
ABSTRACT:
Electrical and mechanical components and associated processes for enhancing automated test of a system by permitting automated generation and application (injection) of real-world stimuli applied to the system under test and sensing responses from the system under test without the need for manual intervention. Test components of the present invention may intercede in the exchange of signals and power over various signaling paths within a system under test. Under programmable control by methods of the invention, the electrical components of the present invention may simulate any desired real-world stimulus on any signal path associated with the system under test. Electromechanical manipulation test components and sensor components allow automation of testing of physical aspects of the system under test. Centralized test sequencing and logic enables simpler test components to permit improved scalability and flexibility of the automated test system and processes.
REFERENCES:
patent: 4474186 (1984-10-01), Ledley et al.
patent: 4578665 (1986-03-01), Yang
patent: 4807161 (1989-02-01), Comfort et al.
patent: 6530054 (2003-03-01), Hollander
patent: 20030043757 (2003-03-01), White
Hagerott Steven G.
Lara John M
Duft Setter Ollila & Bornsen LLC
Hoff Marc S.
LSI Logic Corporation
Suarez Felix
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