Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-01-31
2008-08-19
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000
Reexamination Certificate
active
07415378
ABSTRACT:
The present invention provides a method for analyzing critical defects in analog integrated circuits. The method for analyzing critical defects, among other possible steps, may include fault testing a power field effect transistor (120) portion of an analog integrated circuit (115) to obtain electrical failure data. The method may further include performing an in-line optical inspection of the analog integrated circuit (115) to obtain physical defect data, and correlating the electrical failure data and physical defect data to analyze critical defects.
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KLA-Tencor Website; Assorted archived pages of Dec. 2004.
Flessner Kyle M.
Khandekar Milind V.
Mollat Martin B.
Phan Tony T.
Barlow Jr. John E.
Brady III W. James
Telecky , Jr. Frederick J.
Texas Instruments incorporated
Washburn Douglas N
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