Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-05-22
2007-05-22
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C709S229000, C711S163000, C711S217000, C711S220000
Reexamination Certificate
active
11318222
ABSTRACT:
Methods and apparatus provide for: testing a static random access memory (SRAM) to obtain performance data on the SRAM; and using the performance data as at least a basis of a identification number.
REFERENCES:
patent: 5893910 (1999-04-01), Martineau et al.
patent: 2002/0168815 (2002-11-01), Hartmann
patent: 2004/0053429 (2004-03-01), Muranaka
patent: 2006/0044917 (2006-03-01), Kawakami et al.
patent: 2006/0050580 (2006-03-01), Yamaguchi et al.
Nishino Yoichi
Yoshihara Hiroshi
Barbee Manuel L.
Dernier Matthew B.
Kaplan Gilman Gibson & Dernier LLP
Sony Computer Entertainment Inc.
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