Methods and apparatus for testing a clock signal

Details Methods and apparatus for testing a clock signal Methods and apparatus for testing a clock signal

2005-03-29

2005-03-29

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

06873926

ABSTRACT:
Techniques test a clock signal by comparing different portions of that clock signal to each other. Such techniques enable the detection of a clock signal having anomalies such as missing pulses or occasional delayed pulses. In one arrangement, a data communications device has a clock signal generator, processing circuitry and a test circuit, both of which are coupled to the clock signal generator. The clock signal generator provides a clock signal. The processing circuitry uses the clock signal to receive data elements on a set of input ports, and to transmit the data elements on a set of output ports. The test circuit includes a node that receives the clock signal, a comparison circuit that provides a comparison signal based on a comparison between the clock signal and a delayed copy of the clock signal, and an output circuit that provides a result signal based on the comparison signal.

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