4. Active solid-state devices (e.g., transistors, solid-state diode
  Search
Selected: All
All
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 0 1 2 3 4 5 6 7 8 9 ! " $ ' ( ) * , - / : < = > ? @ [ \ ] ^ ` { | } ~ €

Test structure for a single-sided buried strap DRAM memory...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for charged particle beam inspection and...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for detecting bonding-induced cracks

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for detecting bonding-induced cracks

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for detecting defect size in a semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for determining a doping region of an...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for determining a minimum tunnel opening size...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for determining a region of a deep trench...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for determining electromigration and...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for determining how lithographic patterning of a

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for dielectric film evaluation

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for electrical well-to-well overlay

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for electrically measuring the degree of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for improved vertical memory arrays

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for insulation-film evaluation

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for locating electromigration voids in dual...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure for measuring effective channel length of a...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure of a semiconductor device and semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure of DRAM

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Test structure of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure