LandOfFree - US Patents - Listing for Active solid-state devices (e.g., transistors, solid-state diode

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Test mask structure

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test mode decoder in a flash memory

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Test pads coupled with leads unconnected with die pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test pads on flash memory cards

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test pads on leads unconnected with die pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test pattern for evaluating a process of silicide film...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test pattern for measuring contact resistance and method of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test pattern for measuring line width of electrode and method fo

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Patent

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Test pattern for measuring variations of critical dimensions...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test pattern of CMOS image sensor and method of measuring...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test pattern of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks

Reexamination Certificate

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Test pattern structure

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test patterns and methods of controlling CMP process using...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test patterns for measurement of low-k dielectric cracking...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test piece for X-ray inspection

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Patent

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Test pixel and test pixel array for evaluating pixel quality...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test pixel and test pixel array for evaluating pixel quality...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test region layout for shallow trench isolation

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test site and a method of monitoring via etch depths for semicon

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Patent

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Test socket of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Device held in place by clamping

Reexamination Certificate

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