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Method for determining the thickness of a metallic coating on a

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Method for determining unknown structure of crystal

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for developing an x-ray diffraction imaging system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Method for diaphragm regulation in a computed tomography...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for dynamic range management of digital radiographic...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for eliminating artifacts in scanning electron beam compu

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for estimating a scattered radiation, particularly to...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for estimating scattered ray intensity in X-ray CT...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for estimating the press formability of galvannealed stee

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for estimating the radiation scattered in a...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for estimating the scattered radiation in X-ray...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for evaluating an SOI substrate, evaluation...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for evaluating projection datasets of an object...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for evaluating residual fatigue life of mechanical parts

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for examining a body region executing a periodic motion

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for examining a body region executing a periodic motion

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for examining a body region of an examination object,...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Method for examining a body with penetrating radiation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Method for examining defect in steel bar and apparatus therefor

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method for examining structures on a semiconductor substrate

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
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