Method for determining the thickness of a metallic coating on a

Details Method for determining the thickness of a metallic coating on a Method for determining the thickness of a metallic coating on a

1991-10-28

1992-12-22

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 44, 378 48, G01B 1502

Patent

active

051739291

ABSTRACT:
A method for determining the thickness of an aluminide coating deposited on a gas turbine blade using X-ray spectrometry in which the turbine blade is formed from a nickel-based, high temperature alloy. The method establishes a characteristic secondary emission curve based upon the presence of a boundary layer or a layer of nickel permeating into the aluminide coating layer during the coating process. A characteristic secondary emission curve is formed based upon secondary emission characteristic of nickel. One end of the curve is established by a count rate corresponding to secondary radiation from substantially pure nickel and a second end of the curve corresponds to a count rate representative of secondary emission from either the base material or the coating material. The determination of whether to use the base material or the coating material is dependent upon whether the coating is applied by a packed powder process or by chemical vapor deposition and whether the measurements are to be taken in an emission mode or an absorption mode. In either event, the established curve is utilized by an X-ray spectrometry machine to correlate the count rate and fit the measured count rate onto the curve to provide a direct read-out of thickness of the coating.

REFERENCES:
patent: 4129778 (1978-12-01), Inoue et al.
patent: 4959848 (1990-09-01), Parobek
D. P. Salamida, "Measurement of Selenium Thickness on Nickel Substrate Using Bremsstrahlung Radiation," Radiochem Radioanal. Letters, Mar. 1970, pp. 331-337.
"Standard Method for Measurement of Coating Thickness by X-ray Spectrometry"; ASTM Designation: B 568-85; Feb. 22, 1985.

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