Method for estimating scattered ray intensity in X-ray CT...

Details Method for estimating scattered ray intensity in X-ray CT... Method for estimating scattered ray intensity in X-ray CT...

2008-10-02

2009-10-27

Thomas, Courtney (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Computerized tomography

C382S131000

Reexamination Certificate

active

07609803

ABSTRACT:
A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method includes: irradiating a subject with X-rays; and configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject, on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.

REFERENCES:
patent: 6163589 (2000-12-01), Vartanian
patent: 11-299768 (1999-11-01), None
patent: 2006-334319 (2006-12-01), None
patent: 2007-111314 (2007-05-01), None

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