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Stress measurement method using X-ray diffraction

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Structural and patient positioning features of an x-ray system

X-ray or gamma ray systems or devices – Specific application – Dental panoramic
Reexamination Certificate

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Structural parameter analyzing apparatus and analyzing method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Structured anode X-ray source for X-ray microscopy

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Subassembly, method and system for monochromatizing X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Substance hardness measuring instrument, biological tissue...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Substance quantitative analysis method

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Substrate holding apparatus for holding a substrate in an exposu

X-ray or gamma ray systems or devices – Specific application – Lithography
Patent

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Substrate holding device and exposing apparatus using the same

X-ray or gamma ray systems or devices – Specific application – Lithography
Patent

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Substrate holding device and exposing apparatus using the same

X-ray or gamma ray systems or devices – Specific application – Lithography
Patent

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Substrate holding system and exposure apparatus having the same

X-ray or gamma ray systems or devices – Specific application – Lithography
Patent

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Substrate material for X-ray optical components

X-ray or gamma ray systems or devices – Specific application – Lithography
Reexamination Certificate

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Subtle dynamic helical scan for uniform z-resolution and noise

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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Suitcase compartmentalized for security inspection and system

X-ray or gamma ray systems or devices – Specific application – Absorption
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Support and radiation therapy system

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Support device for a polycapillary optic

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Support structure for mammography

X-ray or gamma ray systems or devices – Specific application – Mammography
Reexamination Certificate

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Support structure for Z-extensible CT detectors and methods...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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Surface channeled X-ray tube

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Surface defect evaluating apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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