X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1992-10-05
1993-09-21
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Absorption
378 54, 378 56, G01N 2306
Patent
active
052475590
ABSTRACT:
Radiation transmission intensity information obtained from a radiation source of two different energy levels or energy bands is used to perform an energy subtraction calculation and quantify the constituent substances of the object being analyzed. The objective is to simultaneously detect and quantify the plural substances composing the object being analyzed in a single operation using a single subtraction calculation equation. An energy subtraction calculation is first performed to eliminate a specific substance in the object being analyzed, making it possible to simultaneously determine the other two constituent substances using the negativity of the calculated result. When three substances are overlapping in the direction of radiation transmission, using the transmission intensity information from a radiation source with only two energy levels, the effect of one substance is eliminated while identifying and quantifying the other two by applying an energy subtraction calculation process that eliminates the first substance and obtains the density of a third substance, and obtains the density of the third substance in an area where the three substances overlap based on the calculated result for the area containing the first and second substances.
REFERENCES:
patent: 3848130 (1974-11-01), Macovski
patent: 4029963 (1977-06-01), Alvarez et al.
patent: 4455669 (1984-06-01), Aichinger et al.
patent: 4626688 (1986-12-01), Barnes
patent: 4811373 (1989-03-01), Stein
patent: 4947414 (1990-08-01), Stein
patent: 4953192 (1990-08-01), Plewes
patent: 4980904 (1990-12-01), Sones et al.
patent: 5033075 (1991-07-01), DeMone et al.
patent: 5040199 (1991-08-01), Stein
patent: 5177776 (1993-01-01), Ohmori et al.
Coleman et al. "A Beam-Hardening Correction Using Dual-Energy Computed Tomography", Phys. Med. Biol., 1985, vol. 30, No. 11, 1251-1256.
Stonestrom et al. "A Framework for Spectral Artifact Correcetions in X-Ray CT", IEEE Transactions on Biomedical Eng., vol. BME-28, No. 2, Feb. 1981.
Ohtsuchi Tetsuro
Tsutsui Hiroshi
Matsushita Electric - Industrial Co., Ltd.
Porta David P.
LandOfFree
Substance quantitative analysis method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Substance quantitative analysis method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substance quantitative analysis method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1056242