Semiconductor device including fuse and method for testing...
Semiconductor device including multi-bit memory cells and a...
Semiconductor device including nonvolatile memory
Semiconductor device including nonvolatile memory
Semiconductor device including semiconductor memory
Semiconductor device including tester circuit suppressible...
Semiconductor device incorporating fuse-type roll call circuit
Semiconductor device incorporating internal power supply for...
Semiconductor device incorporating internal power supply for...
Semiconductor device incorporating internal power supply for...
Semiconductor device incorporating internal voltage down convert
Semiconductor device incorporating voltage reduction circuit the
Semiconductor device making reliable initial setting
Semiconductor device of daisy chain structure having independent
Semiconductor device operable in a plurality of test...
Semiconductor device operating by receiving a plurality of...
Semiconductor device outputting data at a timing with...
Semiconductor device performing test operation under proper cond
Semiconductor device preventing signal delay among wirings
Semiconductor device provided with a circuit performing fast dat