Static information storage and retrieval – Read/write circuit – Testing
Patent
1994-04-14
1995-10-31
Nelms, David C.
Static information storage and retrieval
Read/write circuit
Testing
365226, 365227, 365154, 365156, 371 211, G11C 2900
Patent
active
054635853
ABSTRACT:
A semiconductor device is disclosed which includes a storage area such as a RAM, a register, a latch, or a flip-flop. This device further includes a test mode detection circuit for detecting a test mode and a voltage control circuit for generating a power-down voltage that is lower than a power supply voltage supplied to the device, the power-down voltage being supplied to the storage area to test a data-hold characteristic thereof in the test mode. The power supply voltage is thereby free from being changed.
REFERENCES:
patent: 5132929 (1992-07-01), Ochii
Hoang Huan
NEC Corporation
Nelms David C.
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