Static information storage and retrieval – Read/write circuit – Including signal comparison
Reexamination Certificate
2011-07-19
2011-07-19
Mai, Son (Department: 2827)
Static information storage and retrieval
Read/write circuit
Including signal comparison
C365S185040, C365S195000, C365S196000, C365S201000
Reexamination Certificate
active
07983096
ABSTRACT:
A semiconductor device includes a nonvolatile memory configured to store write data in a write-enabled state, a check circuit configured to enable the write data as data for comparison in response to an enabled-status indicating signal indicative of the write-enabled state and to output a result of comparison obtained by comparing data read from the nonvolatile memory with the enabled data for comparison, and a path configured to output the result of comparison output from the check circuit to outside the semiconductor device, wherein no path to output the data read from the nonvolatile memory to outside the semiconductor device is in existence.
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USPTO, (MAI) Non-Final Rejection, Oct. 19, 2010, in parent U.S. Appl. No. 12/424,814 [pending].
USPTO, [MAI] “U.S. Appl. No. 12/424,814 (parent),” Notice of Allowance and Fee(s) Due, issued on Mar. 9, 2011.
Bandt Andreas
Kuroki Kenichiro
Fujitsu Patent Center
Fujitsu Semiconductor Limited
Mai Son
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