Semiconductor device performing test operation under proper cond

Details Semiconductor device performing test operation under proper cond Semiconductor device performing test operation under proper cond

1998-08-10

2000-11-07

Phan, Trong

Static information storage and retrieval

Read/write circuit

Testing

G11C 700

Patent

active

061445959

ABSTRACT:
A semiconductor device outputs data from a plurality of data nodes during a normal-operation mode, and outputs a test result from at least one of the data nodes during a test-operation mode. The semiconductor device includes a plurality of data-bus lines which convey the data with respect to the data nodes, and a data-bus switch which allows only the data-bus lines corresponding to the at least one of the data nodes to be driven in a first condition of the test-operation mode, and which allows all of the data-bus lines corresponding to the data nodes to be driven in a second condition of the test-operation mode.

REFERENCES:
patent: 5375096 (1994-12-01), Sugibayashi
patent: 5400281 (1995-03-01), Morigami
patent: 5537351 (1996-07-01), Suwa et al.
patent: 5563830 (1996-10-01), Ishida
patent: 5654924 (1997-08-01), Suzuki et al.
patent: 5724366 (1998-03-01), Furutani
patent: 5961657 (1999-10-01), Park et al.
patent: 5963491 (1999-10-01), Arimoto

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